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K4B1G1646I-BYK0 全新原装
K4B1G1646I-BYK0 全新原装
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K4B1G1646I-BYK0 全新原装

型号:

K4B1G1646I-BYK0

制造商:

SAMSUNG/三星

封装:

FBGA

批次:

23+

无铅/环保:

无铅/环保

产品信息

K4B1G1646I-BYK0 全新原装

 

制造商

SAMSUNG

类别

DRAM动态随机存储器

产品种类

DDR3

RoHS

容量

1 GB

封装 / 箱体

96 FBGA

架构

64M x 16

工作温度

0 ~ 85 °C

速度

1600 Mbps

工作电压

1.35V


The 1Gb DDR3 SDRAM I-die is organized as a 8Mbit x 16 I/Os x 8banks device. This synchronous device achieves high speed double-data-rate transfer rates of up to 1866Mb/sec/pin(DDR3-1866)for general applications. The chip is designed to comply with the following key DDR3 SDRAM features such as posted CAS, Programmable CWL, Internal (Self) Calibration, On Die Termination using ODT pin and Asynchronous Reset . 

All of the control and address inputs are synchronized with a pair of externally supplied differential clocks. Inputs are latched at the crosspoint of differential clocks (CK rising and CK falling). All I/Os are synchronized with a pair of bidirectional strobes (DQS and DQS) in a source synchronous fashion. The address bus is used to convey row, column, and bank address information in a RAS/CAS multiplexing style. 

The DDR3 device operates with a single 1.35V(1.28V~1.45V) or 1.5V(1.425V~1.575V) power supply and 1.35V(1.28V~1.45V) or 1.5V(1.425V~1.575V) VDDQ.